Michael Lee Bushnell, PhD | Chief Technology Officer, Professor Emeritus | Spectral Design & Test, Inc.

Michael BushnellMichael Lee Bushnell, PhD recalls his interest in his field began in his youth when his father gave him his 1920s electric train set. As an adult, he got a position as a computer operator and studied computer manuals, specifically self-teaching himself how to operate a machine and how it worked. Pursuing his interests, Dr. Bushnell took on his first position as a summer intern at General Electric Company in the Ordnance Systems Division in 1972 and as an associate engineer in the Design Automation Department at Honeywell Information Systems in 1974, remaining until 1976.

Continuing in his professional endeavors, Dr. Bushnell was a senior systems programmer at Instron Corporation and a member of technical staff within Advanced System Development Department at Applicon, Inc. between 1976 and 1981. Pivoting to education, he was a professor in the Electrical and Computer Engineering Department, CAIP Research Center, Wireless Information Networks Lab, Rutgers Center for Operations Research and School of Engineering at Rutgers University for 27 years until gaining emeritus status in 2013. Today, Dr. Bushnell excels as the co-founder and chief technological officer of Spectral Design and Test, Inc. a role he commenced in 2008.

Notably, Dr. Bushnell holds eight U.S. patents and two European patents with a patent pending in robust delay fault built-in self-testing. In 2019, he was selected for inclusion in Top 100 Magazine “of leading academics and industrial researchers.” Renowned for his expertise, he has written more than 100 papers and publications regarding computer programming and engineering and has been invited to speak and present at more than 55 presentations at universities, conferences and corporations. Among other achievements, Dr. Bushnell earned several awards for his papers, including for “An Area Efficient Mixed-Signal Test Architecture for Systems-on-a-Chip” and “New Graphical I_DDQ Signatures Reduce Defect Level and Yield Loss.”

Dr. Bushnell earned a Bachelor of Science in electrical engineering and computer science from the Massachusetts Institute of Technology in 1975. He went on to matriculate at Carnegie Mellon University, attaining a Master of Science in computer engineering in 1983 and a Doctor of Philosophy in electrical engineering in 1986. He was also a Henry Rutgers Research Fellow at Rutgers University and a Trustee’s Research Fellow for Distinguished Young Scholars. Today, Dr. Bushnell remains a lifetime fellow of the Institute of Electrical and Electronics Engineers and is a member of the Computer Society, Circuits and Systems Society, Communications Society, Association for Computing Machinery and VLSI Society of India.

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